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IEC/PAS 62184

Lead Integrity Test Method

inactive
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Organization: IEC
Publication Date: 1 August 2000
Status: inactive
Page Count: 22

Document History

IEC/PAS 62184
August 1, 2000
Lead Integrity Test Method
A description is not available for this item.

References

This document is replaced by:
IEC 60749-14 - Semiconductor devices Mechanical and climatic test methods Part 14: Robustness of terminations (lead integrity)
Published by IEC on August 1, 2003
A description is not available for this item.
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