scope:

This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes B, Q, and M) and space application (device classes S and V), and a choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). Device class M microcircuits represent non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883, "Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices". When available, a choice of radiation hardness assurance (RHA) levels are reflected in the PIN.

The PIN shall be as shown in the following example:

Device classes M, B, and S RHA marked devices shall meet the MIL-M-38510 specified RHA levels and shall be marked with the appropriate RHA designator. Device classes Q and V RHA marked devices shall meet the MIL-1-38535 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.

The device type(s) shall identify the circuit function as follows:

Access Store Recall Device type Generic number 1/ Circuit function Time Cycle Cycle Endurance 01 10C68 8K × 8 NVSRAM 55 ns 12 ms 25 µs 10,000 cycles 02 10C68 8K × 8 NVSRAM 45 ns 12 ms 25 µs 10,000 cycles 03 10C68 8K × 8 NVSRAM 35 ns 12 ms 25 µs 10,000 cycles 04 10C68 8K × 8 NVSRAM 55 ns 12 ms 25 µs 100,000 cycles 05 10C68 8K × 8 NVSRAM 45 ns 12 ms 25 µs 100,000 cycles 06 10C68 8K × 8 NVSRAN 35 ns 12 ms 25 µs 100,000 cycles

The device class designator shall be a single letter identifying the product assurance level (see 6.6 herein) as follows:

Device class Device requirements documentation M Vendor self-certification to the requirements for non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883 B or S Certification and qualification to MIL-M-38510 Q or V Certification and qualification to MIL-I-38535

The case outline(s) shall be as designated in MIL-STD-1835 and as follows:

Outline letter Descriptive designator Terminals Package style X CDIP3-T28 or GDIP4-T2B 28 Dual in-Line Y CQCC3-N28 28 Rectangular Leadless Chip Carrier

The lead finish shall be as specified in MIL-I-38535 for classes M, B, and S or MIL-I-38535 for classes Q and V. Finish letter "X" shall not be marked on the microcircuit or its packaging. The "X" designation is for use in specifications when lead finishes A, B, and C are considered acceptable and interchangeable without preference.

Supply voltage range (V_CC) - - - - - - - - - - - - - - −0.6 V dc to 7.0 V dc Voltage on DQ_(0-7) with outputs in high Z state - - - −0.5 V to (V_CC + 0.5 V) Input Voltage Operating Range (V_IH, V_IL) - - - - - - - −0.6 V dc to 7.0 V dc Storage Temperature Range - - - - - - - - - - - - - - −65°C to +150°C Maximum Power Dissipation (P_D) - - - - - - - - - - - - 1.0 W Maximum Output Current - - - - - - - - - - - - - - - - 15 mA Lead Temperature (Soldering) - - - - - - - - - - - - - 300°C Junction Temperature (T_j) 4/ - - - - - - - - - - - - - 175°C Thermal Resistance, Junction to Case(θ_Jc): Cases X,Y - See MIL-STD-1835 Data Retention - - - - - - - - - - - - - - - - - - - - 10 Years to nonvolatile array (minimum) Endurance (as Store cycles to non-volatile array)- - - Per 1.2.2

Supply voltage range (V_CC) - - - - - - - - - - - - - - +4.5 V dc to +5.5 V dc Case Operating Temperature Range (T_C) - - - - - - - - −55°C to +125°C Input Voltage low range (V_IL) - - - - - - - - - - - - V_SS−0.5 V dc to 0.8 V dc, all inputs Input Voltage high range (V_IH) - - - - - - - - - - - - 2.2 V dc to V_CC+0.5 V dc, all inputs

Fault coverage measurement of manufacturing logic tests (MIL-STD-883 test method 5012) - - - - - - 3/ percent

intended Use: