CENELEC - EN 60749-12
Semiconductor Devices Mechanical and Climatic Test Methods Part 12: Vibration, Variable Frequency
inactive
| Organization: | CENELEC |
| Publication Date: | 1 August 2002 |
| Status: | inactive |
| Page Count: | 8 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
March 1, 2018
Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency
This part of IEC 60749 describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It...
EN 60749-12
August 1, 2002
Semiconductor Devices Mechanical and Climatic Test Methods Part 12: Vibration, Variable Frequency
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