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JEDEC JESD 22-A110

Test Method A110 Highly-Accelerated Temperature and Humidity Stress Test (HAST)

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Organization: JEDEC
Publication Date: 1 January 1988
Status: inactive
Page Count: 7

Document History

July 1, 2015
Highly Accelerated Temperature and Humidity Stress Test (HAST)
The Highly-Accelerated Temperature and Humidity Stress Test is performed for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments. It employs...
November 1, 2010
Highly Accelerated Temperature and Humidity Stress Test (HAST)
The Highly-Accelerated Temperature and Humidity Stress Test is performed for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments. It employs...
January 1, 2009
Highly Accelerated Temperature and Humidity Stress Test (HAST)
The purpose of this test method is to evaluate the reliability of nonhermetic packaged solid state devices in humid environments. It employs severe conditions of temperature, humidity, and bias that...
February 1, 1999
Test Method A110-B Highly-Accelerated Temperature and Humidity Stress Test (HAST)
A description is not available for this item.
April 1, 1997
Highly-Accelerated Temperature and Humidity Stress Test (HAST)
A description is not available for this item.
JEDEC JESD 22-A110
January 1, 1988
Test Method A110 Highly-Accelerated Temperature and Humidity Stress Test (HAST)
A description is not available for this item.
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