AFNOR - NF EN 62047-2
Semiconductor devices - Micro-electromechanical devices - Part 2 : tensile testing methods of thin film materials
active, Most Current
| Organization: | AFNOR |
| Publication Date: | 1 November 2006 |
| Status: | active |
| ICS Code (Semiconducting materials): | 29.045 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
NF EN 62047-2
November 1, 2006
Semiconductor devices - Micro-electromechanical devices - Part 2 : tensile testing methods of thin film materials
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