AFNOR - NF EN 60749-35
Semiconductor devices - Mechanical and climatic test methods - Part 35 : acoustic microscopy for plastic encapsulated electronic components
active, Most Current
| Organization: | AFNOR |
| Publication Date: | 1 December 2006 |
| Status: | active |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
NF EN 60749-35
December 1, 2006
Semiconductor devices - Mechanical and climatic test methods - Part 35 : acoustic microscopy for plastic encapsulated electronic components
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