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AFNOR - NF EN 60749-35

Semiconductor devices - Mechanical and climatic test methods - Part 35 : acoustic microscopy for plastic encapsulated electronic components

active, Most Current
Organization: AFNOR
Publication Date: 1 December 2006
Status: active
ICS Code (Semiconductor devices in general): 31.080.01

Document History

NF EN 60749-35
December 1, 2006
Semiconductor devices - Mechanical and climatic test methods - Part 35 : acoustic microscopy for plastic encapsulated electronic components
A description is not available for this item.
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