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NPFC - MIL-M-38510/245

MICROCIRCUITS, DIGITAL, CMOS, 4096 BIT, STATIC RANDOM ACCESS MEMORY (SRAM), BULK SILICON AND SILICON ON SAPPHIRE

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Organization: NPFC
Publication Date: 28 January 1987
Status: inactive
Page Count: 62
scope:

This specification covers the detail requirements for bulk silicon and silicon on sapphire (SOS), static, 4096 bit, random access memory microcircuits. Two product assurance classes, four radiation hardness assurance levels, and a choice of case outlines and lead finishes are provided and are reflected in the part number.

The part number shall be in accordance with MIL-M-38510, and as specified herein.

The device type shall be as follows:

Device type Circuit Access time 01 (bulk silicon) 4096×l bit RAM 120 ns 02 (bulk silicon) 1024×4 bit RAM 120 ns 03 (synchronous; bulk silicon) 4096×l bit RAM 320 ns 04 (synchronous; bulk silicon) 1024×4 bit RAM 320 ns 05 (asynchronous; SOS) 4096×l bit RAM 250 ns 06 (asynchronous; SOS) 1024×4 bit RAM 250 ns

The device class shall be the product assurance level as defined in MIL-M-38510.

The case outline shall be designated as follows:

Letter Case outline (see MIL-M-38510, appendix C) V D-6 (18-lead, ¼" × 15/16"), dual-in-line package K F-6A (24-lead, ⅜"× ⅝"), flat package

Radiation hardness levels shall be as defined in MIL-M-38510.

Absolute maximum ratings. Device types 01, 02, 03, 04 Device types 05, 06 Supply voltage range (VDD - VSS) −0.3 V to +7.0 V −0.5 V to +7.0 V Input voltage range VSS −0.3 V to VDD +0.3 V VSS −0.5 V to VDD +0.5 V Input current, any one input 10 mA Storage temperature range −65°C to +150°C −65°C to +150°C Maximum power dissipation 200 mW 500 mW MPD per output transistor 100 mW Lead temperature (soldering) 300°C 300°C 10 seconds maximum Thermal resistance 0.04°C/mW junction to case Junction temperature 175°C 175°C Radiation level As indicated by RHA level designator

Recommended operating conditions. Device types 01, 02, 03, 04 Device types 05, 06 Supply voltage (VDD - VSS) 4.5 V to 5.5 V 4.75 V to 5.25 V Input low (VIL) voltage range VSS −0.3 V to VSS +0.8 V VSS +0.8 V maximum Input high (VIH) voltage range VDD −2.0 V to VDD +0.3 V VDD/2 minimum Case operating temperature range −55°C to + 125°C −55°C to +125°C Timing parameters (See figure 7) (See figure 7)

Beneficial comments (recommendations, additions, deletions) and any pertinent data which may be of use in improving this document should be addressed to: Rome Air Development Center, RADC (RBE-2), Griffiss AFB, NY 13441, by using the self-addressed Standardization Document Improvement Proposal (DD Form 1426) appearing at the end of this document or by letter.

intended Use:

Microcircuits conforming to this specification are intended for original equipment design applications and logistic support of existing equipment.

Document History

June 14, 2023
MICROCIRCUITS, DIGITAL, CMOS, 4096 BIT, STATIC RANDOM ACCESS MEMORY (SRAM), BULK SILICON AND SILICON ON SAPPHIRE
Scope. This specification covers the detail requirements for bulk silicon and silicon on sapphire (SOS), static, 4096 bit, random access memory microcircuits. Two product assurance classes, four...
October 5, 2020
Microcircuits, Digital, CMOS, 4096 Bit, Static Random Access Memory (SRAM), Bulk Silicon and Silicon on Sapphire
A description is not available for this item.
December 22, 2010
Microcircuits, Digital, CMOS, 4096 Bit, Static Random Access Memory (SRAM), Bulk Silicon and Silicon on Sapphire
This specification covers the detail requirements for bulk silicon and silicon on sapphire (SOS), static, 4096 bit, random access memory microcircuits. Two product assurance classes, four radiation...
March 13, 2006
MICROCIRCUITS, DIGITAL, CMOS, 4096 BIT, STATIC RANDOM ACCESS MEMORY (SRAM), BULK SILICON AND SILICON ON SAPPHIRE
This specification covers the detail requirements for bulk silicon and silicon on sapphire (SOS), static, 4096 bit, random access memory microcircuits. Two product assurance classes, four radiation...
April 26, 2001
MICROCIRCUITS, DIGITAL, CMOS, 4096 BIT, STATIC RANDOM ACCESS MEMORY (SRAM), BULK SILICON AND SILICON ON SAPPHIRE
A description is not available for this item.
July 24, 1995
MICROCIRCUITS, DIGITAL, CMOS, 4096 BIT, STATIC RANDOM ACCESS MEMORY (SRAM), BULK SILICON AND SILICON ON SAPPHIRE
A description is not available for this item.
February 24, 1993
MICROCIRCUITS, DIGITAL, CMOS, 4096 BIT, STATIC RANDOM ACCESS MEMORY (SRAM), BULK SILICON AND SILICON ON SAPPHIRE
A description is not available for this item.
June 15, 1990
MICROCIRCUITS, DIGITAL, CMOS, 4096 BIT, STATIC RANDOM ACCESS MEMORY (SRAM), BULK SILICON AND SILICON ON SAPPHIRE
A description is not available for this item.
MIL-M-38510/245
January 28, 1987
MICROCIRCUITS, DIGITAL, CMOS, 4096 BIT, STATIC RANDOM ACCESS MEMORY (SRAM), BULK SILICON AND SILICON ON SAPPHIRE
This specification covers the detail requirements for bulk silicon and silicon on sapphire (SOS), static, 4096 bit, random access memory microcircuits. Two product assurance classes, four radiation...
August 16, 1985
MICROCIRCUITS, DIGITAL, CMOS, 4096 BIT, STATIC RANDOM ACCESS MEMORY (SRAM), BULK SILICON AND SILICON ON SAPPHIRE
A description is not available for this item.
November 21, 1983
MICROCIRCUITS, DIGITAL, CMOS, 4096 BIT, STATIC RANDOM ACCESS MEMORY (SRAM), BULK SILICON AND SILICON ON SAPPHIRE
A description is not available for this item.
April 5, 1983
MICROCIRCUITS, DIGITAL, CMOS, 4096 BIT, STATIC RANDOM ACCESS MEMORY (SRAM), BULK SILICON AND SILICON ON SAPPHIRE
A description is not available for this item.

References

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