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DLA - SMD-5962-91521

MICROCIRCUIT, LINEAR, 12-BIT DATA ACQUISITION SYSTEM, 4-CHANNEL SIMULTANEOUS SAMPLING, MONOLITHIC SILICON

inactive
Organization: DLA
Publication Date: 30 November 1992
Status: inactive
Page Count: 18
scope:

This drawing forms a part of a one part - one part number documentation system (see 6.6 heroin). Two product assurance classes consisting of military high reliability (device classes B, Q, and M) and space application (device classes S and V), and a choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). Device class M microcircuits represent non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883, "Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices". When available, a choice of radiation hardness assurance (RHA) levels are reflected in the PIN.

The PIN shall be as shown in the following example:

Device classes M, B, and S RHA marked devices shall meet the MIL-M-38510 specified RHA levels and shall be marked with the appropriate RHA designator. Device classes Q and V RHA marked devices shall meet the MIL-I-38535 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.

The device type(s) shall identify the circuit function as follows:

Device type Generic number Circuit function 01 AD7874 12-bit data acquisition system, 4-channel simultaneous sampling

The device class designator shall be a single letter identifying the product assurance level as follows:

Device class Device requirements documentation M Vendor self-certification to the requirements for non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883 B or S Certification and qualification to MIL-M-38510 Q or V Certification and qualification to MIL-I-38535

The case outline(s) shall be as designated in MIL-STD-1835 and as follows:

Outline letter Descriptive designator Terminals Package style X GDIP1-T28 or CDIP2-T28 28 Dual-in-line 3 CQCC1-N28 28 Square leadless chip carrier

The Lead finish shall be as specified in MIL-M-38510 for classes M, B, and S or MIL-I-38535 for classes Q end V. Finish letter "X" shall not be marked on the microcircuit or its packaging. The "X" designation is for use in specifications when lead finishes A, B, and C are considered acceptable and interchangeable without preference.

Positive supply voltage range (VDD) to AGND - - - - - - −0.3 V dc to +7.0 V dc Positive supply voltage range (VDD) to DGND - - - - - - −0.3 V dc to +7.0 V dc Negative supply voltage range (VSS) to AGND - - - - - - +0.3 V dc to −7.0 V dc AGND to DGND - - - - - - - - - - - - - - - - - - - - - −0.3 V dc to VDD + 0.3 V dc Analog input range (VIN) - - - - - - - - - - - - - - - −15.0 V dc to + 15.0 V dc Voltage reference output (REF OUT) to analog ground range (AGND) - - - - - - - - - - - 0 V dc to VDD Logic input voltage range - - - - - - - - - - - - - - - −0.3 V dc to VDD + 0.3 V dc Logic output voltage range - - - - - - - - - - - - - - −0.3 V dc to VDD + 0.3 V dc Thermal resistance, junction-to-case (ΘJC) - - - - - - See MIL-STD-1835 Maximum power dissipation (PD) 2/ - - 1,000 mW Lead temperature (soldering, 10 sec.) - - - - - - - - - +300°C Storage temperature range - - - - - - - - - - - - - - - −65°C to +150°C

Positive supply voltage range (VDD) - - - - - - - - - - +4.75 V dc to +5.25 V dc Negative supply voltage range (VSS) - - - - - - - - - - −4.75 V dc to −5.25 V dc Analog input voltage range - - - - - - - - - - - - - - −10.0 V dc to +10.0 V dc Ambient operating temperature range (TA)- - - - - - - - −55°C to +125°C Reference input voltage range - - - - - - - - - - - - - +2.85 V dc to +3.15 V dc

intended Use:

Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.

Microcircuits... View More

Document History

December 8, 2022
MICROCIRCUIT, DIGITAL-LINEAR, 12-BIT DATA ACQUISITION SYSTEM, 4-CHANNEL SIMULTANEOUS SAMPLING, MONOLITHIC SILICON
Scope. This drawing documents two product assurance class levels consisting of high reliability (device class Q and M) and space application (device class V). A choice of case outlines and lead...
February 6, 2017
MICROCIRCUIT, DIGITAL-LINEAR, 12-BIT DATA ACQUISITION SYSTEM, 4-CHANNEL SIMULTANEOUS SAMPLING, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device class Q and M) and space application (device class V). A choice of case outlines and lead finishes are...
January 6, 2005
MICROCIRCUIT, LINEAR, 12-BIT DATA ACQUISITION SYSTEM, 4-CHANNEL SIMULTANEOUS SAMPLING, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
December 20, 1996
MICROCIRCUIT, LINEAR, 12-BIT DATA ACQUISITION SYSTEM, 4-CHANNEL SIMULTANEOUS SAMPLING, MONOLITHIC SILICON
A description is not available for this item.
August 12, 1994
MICROCIRCUIT, LINEAR, 12-BIT DATA ACQUISITION SYSTEM, 4-CHANNEL SIMULTANEOUS SAMPLING, MONOLITHIC SILICON
A description is not available for this item.
SMD-5962-91521
November 30, 1992
MICROCIRCUIT, LINEAR, 12-BIT DATA ACQUISITION SYSTEM, 4-CHANNEL SIMULTANEOUS SAMPLING, MONOLITHIC SILICON
This drawing forms a part of a one part - one part number documentation system (see 6.6 heroin). Two product assurance classes consisting of military high reliability (device classes B, Q, and M) and...
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