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NPFC - MIL-E-63300

ELECTRONIC ASSEMBLY FOR MINE, ANTIPERSONNEL, HE, M74

active, Most Current
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Organization: NPFC
Publication Date: 15 August 1997
Status: active
Page Count: 1

Document History

MIL-E-63300
December 3, 2013
Electronic Assembly for Mine, Antipersonnel, HE, M74
A description is not available for this item.
MIL-E-63300
August 15, 1997
ELECTRONIC ASSEMBLY FOR MINE, ANTIPERSONNEL, HE, M74
A description is not available for this item.
MIL-E-63300
July 8, 1986
ELECTRONIC ASSEMBLY FOR MINE, ANTIPERSONNEL, HE, M74
A description is not available for this item.
MIL-E-63300
January 4, 1983
ELECTRONIC ASSEMBLY FOR MINE, ANTIPERSONNEL, HE, M74
A description is not available for this item.
MIL-E-63300
October 21, 1982
ELECTRONIC ASSEMBLY FOR MINE, ANTIPERSONNEL, HE, M74
A description is not available for this item.
MIL-E-63300
February 26, 1982
ELECTRONIC ASSEMBLY FOR MINE, ANTIPERSONNEL, HE, M74
A description is not available for this item.
MIL-E-63300
April 30, 1981
ELECTRONIC ASSEMBLY FOR MINE, ANTIPERSONNEL, HE, M74
A description is not available for this item.
MIL-E-63300
August 24, 1979
ELECTRONIC ASSEMBLY FOR MINE, ANTIPERSONNEL, HE, M74
A description is not available for this item.
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References

This document references:
MIL-A-48078 - Ammunition, Standard Quality Assurance Provisions, General Specification for
Published by NPFC on October 18, 2013
A description is not available for this item.
This document references:
MIL-PRF-50884G (1) - PRINTED WIRING BOARD, FLEXIBLE OR RIGID−FLEX, GENERAL SPECIFICATION FOR
Published by DLA on September 21, 2023
A description is not available for this item.
This document references:
MIL-STD-202 - TEST METHOD STANDARD ELECTRONIC AND ELECTRICAL COMPONENT PARTS
Published by NPFC on February 6, 1956
A description is not available for this item.
This document references:
MIL-STD-750F CHANGE 3 - TEST METHODS FOR SEMICONDUCTOR DEVICES
Published by DLA on April 1, 2021
Purpose. This standard establishes uniform methods and procedures for testing semiconductor devices suitable for use within Military and Aerospace electronic systems. The methods and procedures in...
This document references:
MIL-STD-883 - TEST METHOD STANDARD MICROCIRCUITS
Published by NPFC on September 16, 2019
Purpose. This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic...
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