CEN - EN ISO 9220
Metallic Coatings - Measurement of Coating Thickness - Scanning Electron Microscope Method
inactive
| Organization: | CEN |
| Publication Date: | 1 January 1994 |
| Status: | inactive |
| Page Count: | 16 |
| ICS Code (Linear and angular measurements): | 17.040 |
Document History
February 1, 2022
Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
This document specifies a destructive method for the measurement of the local thickness of metallic and other inorganic coatings by examination of cross-sections with a scanning electron microscope...
EN ISO 9220
January 1, 1994
Metallic Coatings - Measurement of Coating Thickness - Scanning Electron Microscope Method
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