Guide for Measurement of Ionizing Dose-Rate Burnout of Semiconductor Devices
|Publication Date:||10 May 1998|
|ICS Code (Semiconductor devices in general):||31.080.01|
1.1 This guide defines the detailed requirements for testing microcircuits for short pulse high dose-rate ionization-induced failure. Large flash x-ray (FXR) machines operated in the photon mode, or FXR e-beam facilities are required because of the high dose-rate levels that are necessary to cause burnout. Two modes of test are possible: (1) A survival test, and (2) A failure level test.
1.2 The values stated in International System of Units (SI) are to be regarded as standard. No other units of measurement are included in this standard.