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DLA - SMD-5962-90654

MICROCIRCUIT, DIGITAL, HIGH-SPEED CMOS, ANALOG MUTIPLEXER/DEMULTIPLEXER, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON

inactive
Organization: DLA
Publication Date: 30 December 1991
Status: inactive
Page Count: 16
scope:

This drawing form a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes B, Q, and M) and space application (device classes S and V), and a choice of case outlines and lead finishes are available and are reflected in the part or Identifying Number (PIN). Device class N microcircuits represent non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883, "Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices". When available, a choice of radiation hardness assurance (RHA) levels are reflected in the PIN.

The PIN shall be as shown in the following example:

Device classes M, B, and S RHA marked devices shall meet the MIL-M-38510 specified RHA levels and shall be marked with the appropriate RHA designator. Device classes Q and V RHA marked devices shall meet the MIL-I-38535 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (−) indicates a non-RHA device.

The device type(s) shall identify the circuit function as follows:

Device type Generic number Circuit function 01 54HCT4051 Analog multiplexer/demultiplexer, TTL compatible inputs

The device class designator shall be a single letter identifying the product assurance level as follows:

Device class Device requirements documentation M Vendor self-certification to the requirements for non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883 B or S Certification and qualification to MIL-M-38510 Q or V Certification and qualification to MIL-I-38535

For device classes M, B, and S, case outline(s) shall meet the requirements in appendix C of MIL-M-38510 and as listed below. For device classes Q and V, case outline(s) shall meet the requirements of MIL-I-38535, appendix C of MIL-M-38510, and as listed below.

Outline letter Case outline E D-2 (16-lead, .840" × .310" × .200"), dual-in-line package

The lead finish shall be as specified in MIL-M-38510 for classes M, B, and S or MIL-I-38535 for classes Q and V. Finish Letter "X" shall not be marked on the microcircuit or its packaging. The "X" designation is for use in specifications when lead finishes A, B, and C are considered acceptable and interchangeable without preference.

Supply voltage range (VCC − VEE) - - - - - - - - - −0.5 V dc to +10.5 V dc Supply voltage range (VCC) - - - - - - - - - - - - −0.5 V dc to +7.0 V dc Supply voltage range (VEE) - - - - - - - - - - - - - +0.5 V dc to −7.0 V dc DC control input voltage - - - - - - - - - - - - - - −0.5 V dc to VCC + 0.5 V dc DC switch input voltage - - - - - - - - - - - - - - VEE − 0.5 V dc to VCC + 0.5 V dc DC VEE current - - - - - - - - - - - - - - - −20 mA DC control input clamp diode current - - - - - - - - −20 mA DC switch "ON" I/O current (per pin) - - - - - - - - ±25 mA 2/ DC switch I/O diode current (per pin) - - - - - - - ±20 mA 2/ DC VCC or GND current (per pin) - - - - - - - - - - ±50 mA Storage temperature range - - - - - - - - - - - - - −65°C to +150°C Maximum power dissipation (PD) - - - - - - - - - - - 500 mW 3/ Lead temperature (soldering, 10 seconds) - - - - - - +300°C Thermal resistance, junction-to-case (ΘJC) - - - - - See MIL-M-38510, appendix C Junction temperature (TJ) - - - - - - - - - - - - - +175°C

Supply voltage (VCC) - - - - - - - - - - - - - - - +4.5 V dc to +5.5 V dc Supply voltage (VEE) - - - - - - - - - - - - - - - −5.5 V dc to 0.0 V dc Supply voltage range (VCC − VEE) - - - - - - - - - 2.2 V dc to +10.0 V dc Input voltage (VIN), digital inputs - - - - - - - - 0.0 V dc to VCC Analog switch I/O voltage (VIS), analog inputs - - - VEE to VCC Case operating temperature range (TC) - - - - - - - −55°C to +125°C Control input rise and fall time (tr, tf): VCC = 4.5 V, 5.5 V - - - - - - - - - - - - - - - - 0 to 500 ns

Fault coverage measurement of manufacturing logic tests (MIL-STD-883, test method 5012) - - - - - - XX percent 4/

intended Use:

Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, end logistics purposes.

Microcircuits... View More

Document History

August 22, 2023
MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, ANALOG MULTIPLEXER/DEMULTIPLEXER, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes. Replaceability....
April 25, 2017
MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, ANALOG MULTIPLEXER/DEMULTIPLEXER, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device class Q and M) and space application (device class V). A choice of case outlines and lead finishes are...
April 19, 2012
MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, ANALOG MULTIPLEXER/DEMULTIPLEXER, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes. Replaceability....
March 16, 2006
MICROCIRCUIT, DIGITAL, HIGH-SPEED CMOS, ANALOG MUTIPLEXER/DEMULTIPLEXER, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
SMD-5962-90654
December 30, 1991
MICROCIRCUIT, DIGITAL, HIGH-SPEED CMOS, ANALOG MUTIPLEXER/DEMULTIPLEXER, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
This drawing form a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes B, Q, and M) and...

References

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