AFNOR - NF EN 60749-5
Semiconductor devices - Mechanical and climatic test methods - Part 5 : steady-state temperature humidity bias life test
inactive
| Organization: | AFNOR |
| Publication Date: | 1 June 2003 |
| Status: | inactive |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
July 7, 2017
Semiconductor devices - Mechanical and climatic test methods - Part 5 : steady-state temperature humidity bias life test
A description is not available for this item.
NF EN 60749-5
June 1, 2003
Semiconductor devices - Mechanical and climatic test methods - Part 5 : steady-state temperature humidity bias life test
A description is not available for this item.
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