scope:

1. Scope

1.1 This test method covers the measurement of leakage currents of transistors and diodes. These procedures are intended for the measurement of currents in the range from 10−11 to 10−3 A.

1.2 This test method may be used with either a virtual-ground current meter or a resistance-shunt current meter.

1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.