IEEE 1160
Standard Test Procedures for High-Purity Germanium Crystals for Radiation Detectors
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| Organization: | IEEE |
| Publication Date: | 1 January 1993 |
| Status: | active |
| Page Count: | 36 |
scope:
This standard applies to the measurement of bulk properties of high-purity germanium as they relate to the fabrication and performance of germanium detectors for gamma rays and x rays. Such germanium is monocrystalline and has a net concentration of fewer than 1011 electrically active impurity centers per cm3 , usually on the order of 1010 cm-3. Test and measurement procedures for fabricated germanium detectors are given in IEEE Std 325-1986 and IEEE Std 759-1984.
Document History
IEEE 1160
January 1, 1993
Standard Test Procedures for High-Purity Germanium Crystals for Radiation Detectors
This standard applies to the measurement of bulk properties of high-purity germanium as they relate to the fabrication and performance of germanium detectors for gamma rays and x rays. Such germanium...
January 1, 1993
Standard Test Procedures for High-Purity Germanium Crystals for Radiation Detectors
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