JEDEC JESD 22-A117
Electrically Erasable Programmable ROM (EEPROM) Program/Erase Endurance and Data Retention Test
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| Organization: | JEDEC |
| Publication Date: | 1 March 2006 |
| Status: | inactive |
| Page Count: | 16 |
Document History
November 1, 2018
Electrically Erasable Programmable ROM (EEPROM) Program / Erase Endurance and Data Retention Stress Test
This standard specifies the procedural requirements for performing valid endurance, retention and crosstemperature tests based on a qualification specification. Endurance and retention qualification...
August 1, 2018
Electrically Erasable Programmable ROM (EEPROM) Program/Erase Endurance and Data Retention Stress Test
This standard specifies the procedural requirements for performing valid endurance and retention tests based on a qualification specification. Endurance and retention qualification specifications...
October 1, 2011
Electrically Erasable Programmable ROM (EEPROM) Program/Erase Endurance and Data Retention Stress Test
This stress test is intended to determine the ability of an EEPROM integrated circuit or an integrated circuit with an EEPROM module (such as a microprocessor) to sustain repeated data changes...
March 1, 2009
Electrically Erasable Programmable ROM (EEPROM) Program/Erase Endurance and Data Retention Stress Test
This method establishes a standard procedure for determining the data cycling endurance and data retention capability of non-volatile memory cells. It is intended as a qualification and monitor test...
JEDEC JESD 22-A117
March 1, 2006
Electrically Erasable Programmable ROM (EEPROM) Program/Erase Endurance and Data Retention Test
A description is not available for this item.
January 1, 2000
Electrically Erasable Programmable ROM (EEPROM) Program/Erase Endurance and Data Retention Test
A description is not available for this item.