CENELEC - EN 60749-18
Semiconductor devices - Mechanical and climatic test methods Part 18: Ionizing radiation (total dose)
inactive
| Organization: | CENELEC |
| Publication Date: | 1 February 2003 |
| Status: | inactive |
| Page Count: | 18 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
May 1, 2019
Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)
This part of IEC 60749 provides a test procedure for defining requirements for testing packaged semiconductor integrated circuits and discrete semiconductor devices for ionizing radiation (total...
EN 60749-18
February 1, 2003
Semiconductor devices - Mechanical and climatic test methods Part 18: Ionizing radiation (total dose)
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