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IEC 60747-10

Semiconductor devices - Part 10: Generic specification for discrete devices and integrated circuits

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Organization: IEC
Publication Date: 1 April 1991
Status: inactive
Page Count: 104
ICS Code (Semiconductor devices): 31.080
scope:

This publication forms part of the IEC Quality Assessment System for Electronic Components (IECQ).

This publication is a generic specification for semiconductor devices: discrete devices and integrated circuits, including multichip integrated circuits, but excluding hybrid circuits.

It defines general procedures for quality assessment to be used in the IECQ System and gives general rules for:

- measurement methods of electrical characteristics;

- climatic and mechanical tests;

- endurance tests.

NOTE - This publication must be supplemented by the approved sectional, family and blank detail specifications, where they exist, appropriate to the specific individual type or types.

Document History

IEC 60747-10
April 1, 1991
Semiconductor devices - Part 10: Generic specification for discrete devices and integrated circuits
This publication forms part of the IEC Quality Assessment System for Electronic Components (IECQ). This publication is a generic specification for semiconductor devices: discrete devices and...

References

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