DS/IEC 749
Semiconductor devices - Mechanical and climatic test methods
inactive, Most Current
| Organization: | DS |
| Publication Date: | 1 January 1986 |
| Status: | inactive |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
scope:
The standard lists test methods applicable to semiconductor devices (discrete devices and integrated circuits) from which a selection may be made. Establishes uniform preferred test methods with preferred values for stress levels for judging the enviromental properties of semiconductor devices.
Document History
DS/IEC 749
January 1, 1986
Semiconductor devices - Mechanical and climatic test methods
The standard lists test methods applicable to semiconductor devices (discrete devices and integrated circuits) from which a selection may be made. Establishes uniform preferred test methods with...
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