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ASTM F676

Standard Test Method for Measuring Unsaturated TTL Sink Current

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Organization: ASTM
Publication Date: 10 December 1997
Status: inactive
Page Count: 3
ICS Code (Transistors): 31.080.30
scope:

1. Scope

1.1 This test method covers the measurement of the unsaturated sink current of transistor-transistor logic (TTL) devices under specified conditions.

1.2 Units--The values stated in the International System of Units (SI) are to be regarded as standard. No other units of measurement are included in this standard.

1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Document History

December 10, 1997
Standard Test Method for Measuring Unsaturated TTL Sink Current
This test method covers the measurement of the unsaturated sink current of transistor-transistor logic (TTL) devices under specified conditions. Units - The values stated in the International System...
ASTM F676
December 10, 1997
Standard Test Method for Measuring Unsaturated TTL Sink Current
1. Scope 1.1 This test method covers the measurement of the unsaturated sink current of transistor-transistor logic (TTL) devices under specified conditions. 1.2 Units--The values stated in the...
April 15, 1993
Standard Test Method for Measuring Unsaturated TTL Sink Current
A description is not available for this item.
May 27, 1983
STANDARD TEST METHOD FOR MEASURING UNSATURATED TTL SINK CURRENT (R 1988)
A description is not available for this item.

References

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