ECIA - EIA-364-46
TP-46B Microsecond Discontinuity Test Procedure for Electrical Connectors, Contacts and Sockets
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| Organization: | ECIA |
| Publication Date: | 1 January 2006 |
| Status: | inactive |
| Page Count: | 14 |
scope:
This procedure is to define a method of detecting a discontinuity of one microsecond or longer in a mated electrical connector, contact or socket. This procedure shall not be used for durations less than one microsecond; see EIA-364-87, test procedure for nanosecond event detection.
Definition
A discontinuity is defined as a series loop resistance of 10 ohms or greater lasting for one microsecond or longer, measured at the detector input unless otherwise specified in the referencing document.
Document History
November 1, 2012
TP-46C Microsecond Discontinuity Test Procedures for Electrical Connectors, Contacts and Sockets
This procedure is to define a method of detecting a discontinuity of one microsecond or longer in a mated electrical connector, contact or socket. This procedure shall not be used for durations less...
November 1, 2012
TP-46C Microsecond Discontinuity Test Procedures for Electrical Connectors, Contacts and Sockets
This procedure is to define a method of detecting a discontinuity of one microsecond or longer in a mated electrical connector, contact or socket. This procedure shall not be used for durations less...
EIA-364-46
January 1, 2006
TP-46B Microsecond Discontinuity Test Procedure for Electrical Connectors, Contacts and Sockets
This procedure is to define a method of detecting a discontinuity of one microsecond or longer in a mated electrical connector, contact or socket. This procedure shall not be used for durations less...
October 1, 1998
TP-46A Microsecond Discontinuity Test Procedure for Electrical Connectors, Contacts and Sockets
A description is not available for this item.
January 1, 1984
TP-46 Continuity Test Procedure for Electrical Connectors
A description is not available for this item.