CENELEC - EN 60444-8
Measurement of quartz crystal unit parameters Part 8: Test fixture for surface mounted quartz crystal units
inactive
| Organization: | CENELEC |
| Publication Date: | 1 October 2003 |
| Status: | inactive |
| Page Count: | 14 |
| ICS Code (Piezoelectric devices): | 31.140 |
Document History
April 1, 2017
Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units
This part of IEC 60444 describes test fixtures suitable for leadless surface mounted quartz crystal units in enclosures as defined in IEC 61837 (all parts). These fixtures allow the measurement of...
EN 60444-8
October 1, 2003
Measurement of quartz crystal unit parameters Part 8: Test fixture for surface mounted quartz crystal units
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