DS/EN 60749-13
Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere
inactive
| Organization: | DS |
| Publication Date: | 23 September 2002 |
| Status: | inactive |
| Page Count: | 11 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
scope:
This part of IEC 60749 describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment.
Document History
December 23, 2003
Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere
This part of IEC 60749 describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast...
DS/EN 60749-13
September 23, 2002
Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere
This part of IEC 60749 describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast...
Semiconductor devices – Mechanical and climatic test methods – Part 13: Salt atmosphere
This part of IEC 60749 describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast...
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