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ASTM F1467

Standard Guide for Use of an X-Ray Tester (is Approximately Equal to 10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits

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Organization: ASTM
Publication Date: 1 January 1994
Status: inactive
Page Count: 17
ICS Code (Electronic components in general): 31.020

Document History

March 1, 2018
Standard Guide for Use of an X-Ray Tester ('10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
This guide covers recommended procedures for the use of X-ray testers (that is, sources with a photon spectrum having ≈10 keV mean photon energy and ≈50 keV maximum energy) in testing semiconductor...
October 1, 2011
Standard Guide for Use of an X-Ray Tester (≈ 10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
This guide covers recommended procedures for the use of X-ray testers (that is, sources with a photon spectrum having '10 keV mean photon energy and '50 keV maximum energy) in testing semiconductor...
January 10, 1999
Standard Guide for Use of an X-Ray Tester (is Approximately Equal to 10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
This guide covers recommended procedures for the use of X-ray testers (that is, sources with a photon spectrum having ≈10 keV mean photon energy and ≈50 keV maximum energy) in testing semiconductor...
January 10, 1999
Standard Guide for Use of an X-Ray Tester (is Approximately Equal to 10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
1. Scope 1.1 This guide covers recommended procedures for the use of X-ray testers (that is, sources with a photon spectrum having ≈10 keV mean photon energy and ≈50 keV maximum energy) in testing...
January 10, 1999
Standard Guide for Use of an X-Ray Tester (≈ 10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
This guide covers recommended procedures for the use of X-ray testers (that is, sources with a photon spectrum having '10 keV mean photon energy and '50 keV maximum energy) in testing semiconductor...
ASTM F1467
January 1, 1994
Standard Guide for Use of an X-Ray Tester (is Approximately Equal to 10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
A description is not available for this item.
February 15, 1993
STANDARD GUIDE FOR USE OF AN X-RAY TESTER (IS APPROXIMATELY EQUAL TO 10 KEV PHOTONS) IN IONIZING RADIATION EFFECTS TESTING OF MICROELECTRONIC DEVICES
A description is not available for this item.

References

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