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DLA - DESC-DWG-85019

DELAY LINES, PROGRAMMABLE 16 PIN COMPATIBLE, 3 BIT, TTL COMPATIBLE

inactive
Organization: DLA
Publication Date: 13 June 1985
Status: inactive
Page Count: 7

Document History

DSCC-DWG-85019
June 24, 2008
DELAY LINES, PROGRAMMABLE 16 PIN COMPATIBLE, 3 BIT, TTL COMPATIBLE
Devices conforming to this drawing are intended for use when military specifications do not exist and qualified military devices that will perform the required function are not available for OEM...
DESC-DWG-85019 REV D
December 22, 1993
DELAY LINES, PROGRAMMABLE 16 PIN COMPATIBLE, 3 BIT, TTL COMPATIBLE
Devices conforming to this drawing are intended for use when military specifications do not exist and qualified military devices that will perform the required function are not available for OEM...
DESC-DWG-85019 REV C
September 9, 1992
DELAY LINES, PROGRAMMABLE 16 PIN COMPATIBLE, 3 BIT, TTL COMPATIBLE
A description is not available for this item.
DESC-DWG-85019 REV B
November 26, 1991
DELAY LINES, PROGRAMMABLE 16 PIN COMPATIBLE, 3 BIT, TTL COMPATIBLE
A description is not available for this item.
DESC-DWG-85019 REV A
August 26, 1988
DELAY LINES, PROGRAMMABLE 16 PIN COMPATIBLE, 3 BIT, TTL COMPATIBLE
A description is not available for this item.
DESC-DWG-85019
June 13, 1985
DELAY LINES, PROGRAMMABLE 16 PIN COMPATIBLE, 3 BIT, TTL COMPATIBLE
A description is not available for this item.
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References

This document references:
MIL-D-83532 - DELAY LINES, ACTIVE, GENERAL SPECIFICATION FOR
Published by NPFC on February 5, 1993
A description is not available for this item.
This document references:
MIL-STD-1276 - LEADS FOR ELECTRONIC COMPONENT PARTS
Published by NPFC on February 12, 2018
This standard establishes the method of identifying, specifying, and limiting to a minimum the combinations of basic materials, the thickness and composition of the plating used therewith, and the...
This document references:
MIL-STD-202 - TEST METHOD STANDARD ELECTRONIC AND ELECTRICAL COMPONENT PARTS
Published by NPFC on February 6, 1956
A description is not available for this item.
This document references:
MIL-STD-883 - TEST METHOD STANDARD MICROCIRCUITS
Published by NPFC on September 16, 2019
Purpose. This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic...
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