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AFNOR - NF EN 60749-31

Semiconductor devices - Mechanical and climatic test methods - Part 31 : flammability of plastic-encapsulated devices (internally induced)

active, Most Current
Organization: AFNOR
Publication Date: 1 November 2003
Status: active
ICS Code (Semiconductor devices in general): 31.080.01

Document History

NF EN 60749-31
November 1, 2003
Semiconductor devices - Mechanical and climatic test methods - Part 31 : flammability of plastic-encapsulated devices (internally induced)
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