UNLIMITED FREE
ACCESS
TO THE WORLD'S BEST IDEAS

SUBMIT
Already a GlobalSpec user? Log in.

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

Customize Your GlobalSpec Experience

Finish!
Privacy Policy

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

DLA - SMD-5962-96636 REV B

MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, INVERTING HEX BUFFER/CONVERTER, MONOLITHIC SILICON

inactive
Organization: DLA
Publication Date: 4 December 1997
Status: inactive
Page Count: 26
scope:

This appendix establishes minimum requirements for microcircuit die to be supplied under the Qualified Manufacturers List (QML) Program. QML microcircuit die meeting the requirements of MIL-PRF-38535 and the manufacturers approved QM plan for use in monolithic microcircuits, multichip modules (MCMs), hybrids, electronic modules, or devices using chip and wire designs in accordance with MIL-PRF-38534 are specified herein. Two product assurance classes consisting of military high reliability (device class Q) and space application (device Class V) are reflected in the Part or Identification Number (PIN). When available a choice of Radiation Hardiness Assurance (RHA) levels are reflected in the PIN.

The PIN shall be as shown in the following example:

Device classes Q and V RHA identified die shall meet the MIL-PRF-38535 specified RHA levels. A dash (−) indicates a non-RHA die.

The device type(s) shall identify the circuit function as follows:

Device type Generic number Circuit function 01 4049UB Radiation Hardened, CMOS, hex buffer/converter. 02 4049UBN Radiation Hardened, CMOS, hex buffer/converter, neutron irradiated die.

Device class Device requirements documentation Q or V Certification and qualification to the die requirements of MIL-PRF-38535.

The die details designation shall be a unique letter which designates the die's physical dimensions, bonding pad location(s) and related electrical function(s), interface materials, and other assembly related information, for each product and variant supplied to this appendix.

Die Types Figure number 01, 02 A-1

Die Types Figure number 01, 02 A-1

Die Types Figure number 01, 02 A-1

Die Types Figure number 01, 02 A-1

See paragraph 1.3 within the body of this drawing for details.

See paragraph 1.4 within the body of this drawing for details.

intended Use:

Microcircuit die conforming to this drawing are intended for use in microcircuits built in accordance with MIL-PRF-38535 or MIL-PRF-38534 for government microcircuit applications (original... View More

Document History

January 20, 2021
MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, INVERTING HEX BUFFER/CONVERTER, MONOLITHIC SILICON
Scope. This drawing documents three product assurance class levels consisting of high reliability (device classes Q and M), space application (device class V) and for appropriate satellite and...
August 21, 2015
MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, INVERTING HEX BUFFER/CONVERTER, MONOLITHIC SILICON
This drawing documents three product assurance class levels consisting of high reliability (device classes Q and M), space application (device class V) and for appropriate satellite and similar...
September 8, 2005
MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, INVERTING HEX BUFFER/CONVERTER, MONOLITHIC SILICON
This drawing documents three product assurance class levels consisting of high reliability (device classes Q and M), space application (device class V) and for appropriate satellite and similar...
April 28, 1999
MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, INVERTING HEX BUFFER/CONVERTER, MONOLITHIC SILICON
This drawing documents three product assurance class levels consisting of high reliability (device classes Q and M), space application (device class V) and for appropriate satellite and similar...
December 3, 1998
MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, INVERTING HEX BUFFER/CONVERTER, MONOLITHIC SILICON
This drawing documents three product assurance class levels consisting of high reliability (device classes Q and M), space application (device class V) and for appropriate satellite and similar...
SMD-5962-96636 REV B
December 4, 1997
MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, INVERTING HEX BUFFER/CONVERTER, MONOLITHIC SILICON
This appendix establishes minimum requirements for microcircuit die to be supplied under the Qualified Manufacturers List (QML) Program. QML microcircuit die meeting the requirements of MIL-PRF-38535...
December 19, 1996
MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, INVERTING HEX BUFFER/CONVERTER, MONOLITHIC SILICON
A description is not available for this item.
December 14, 1995
MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, INVERTING HEX BUFFER/CONVERTER, MONOLITHIC SILICON
This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes Q and M) and...
Advertisement