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DLA - SMD-5962-96615 REV B

MICROCIRCUIT, DIGITAL, RADIATION HARDENED CMOS, 8-BIT ADDRESSABLE LATCH, MONOLITHIC SILICON

inactive
Organization: DLA
Publication Date: 25 July 1997
Status: inactive
Page Count: 26

Document History

April 14, 2023
MICROCIRCUIT, DIGITAL, RADIATION HARDENED CMOS, 8-BIT ADDRESSABLE LATCH, MONOLITHIC SILICON
Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q) and space application (device class V). A choice of case outlines and lead finishes...
July 1, 2016
MICROCIRCUIT, DIGITAL, RADIATION HARDENED CMOS, 8-BIT ADDRESSABLE LATCH, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
April 19, 2010
MICROCIRCUIT, DIGITAL, RADIATION HARDENED CMOS, 8-BIT ADDRESSABLE LATCH, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
October 16, 2003
MICROCIRCUIT, DIGITAL, RADIATION HARDENED CMOS, 8-BIT ADDRESSABLE LATCH, MONOLITHIC SILICON
A description is not available for this item.
SMD-5962-96615 REV B
July 25, 1997
MICROCIRCUIT, DIGITAL, RADIATION HARDENED CMOS, 8-BIT ADDRESSABLE LATCH, MONOLITHIC SILICON
A description is not available for this item.
March 28, 1997
MICROCIRCUIT, DIGITAL, RADIATION HARDENED CMOS, 8-BIT ADDRESSABLE LATCH, MONOLITHIC SILICON
This appendix establishes minimum requirements for microcircuit die to be supplied under the Qualified Manufacturers List (QML) Program. QML microcircuit die meeting the requirements of MIL-PRF-38535...
December 5, 1995
MICROCIRCUIT, DIGITAL, RADIATION HARDENED CMOS, 8-BIT ADDRESSABLE LATCH, MONOLITHIC SILICON
This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes Q and M) and...
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