JEDEC JESD 390
Noise Margin Measurements for Semiconductor Logic Gating Microcircuits, Test Procedure for
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| Organization: | JEDEC |
| Publication Date: | 1 January 1981 |
| Status: | inactive |
| Page Count: | 13 |
Document History
February 1, 1981
Standard Test Procedure for Noise Margin Measurements for Semiconductor Logic Gating Microcircuits
A description is not available for this item.
JEDEC JESD 390
January 1, 1981
Noise Margin Measurements for Semiconductor Logic Gating Microcircuits, Test Procedure for
A description is not available for this item.