JEDEC JEP 118
Guidelines for GaAs MMIC and FET Life Testing
inactive
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| Organization: | JEDEC |
| Publication Date: | 1 January 1993 |
| Status: | inactive |
| Page Count: | 20 |
scope:
These guidelines apply to monolithic microwave GaAs integrated circuits (MMICs) and their individual component building blocks, such as GaAs field effect transistors (FETs), resistors, and capacitors. The purpose of this document is to define a standard approach for evaluating the expected live of GaAs MMICs so that results from different life tests can be compared and so that wording of this document that the MMIC contains at least one FET, but the use of this document has no such limitation.
Document History
December 1, 2018
Guidelines for GaAs MMIC PHEMT/MESFET and HBT Reliability Accelerated Life Testing
Life tests are run for various purposes. Tests run to detect the level of infant mortality involve short time duration; unless the percentage of devices having infant mortality is extremely high, the...
JEDEC JEP 118
January 1, 1993
Guidelines for GaAs MMIC and FET Life Testing
These guidelines apply to monolithic microwave GaAs integrated circuits (MMICs) and their individual component building blocks, such as GaAs field effect transistors (FETs), resistors, and...
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