AFNOR - NF EN 60749-11
Semiconductor devices - Mechanical and climatic test methods - Part 11 : rapid change of temperature - Two-fluid-bath method
active, Most Current
| Organization: | AFNOR |
| Publication Date: | 1 December 2002 |
| Status: | active |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
NF EN 60749-11
December 1, 2002
Semiconductor devices - Mechanical and climatic test methods - Part 11 : rapid change of temperature - Two-fluid-bath method
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