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DLA - SMD-5962-96793

MICROCIRCUIT, DIGITAL, VARIABLE LENGTH SHIFT REGISTER, MONOLITHIC SILICON

inactive
Organization: DLA
Publication Date: 10 February 1997
Status: inactive
Page Count: 16
scope:

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN.

The PIN is as shown in the following example:

Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.

The device type(s) identify the circuit function as follows:

Device type Generic number Circuit function Frequency 01 L10c11 4/8-bit variable length shift register 30 ns 02 L10c11 4/8-bit variable length shift register 25 ns 03 L10c11 4/8-bit variable length shift register 20 ns 04 L21c11 8-bit variable length shift register 30 ns 05 L21c11 8-bit variable length shift register 25 ns 06 L21c11 8-bit variable length shift register 20 ns

The device class designator is a single letter identifying the product assurance level as follows:

Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535

The case outline(s) are as designated in MIL-STD-1835 and as follows:

Outline letter Descriptive designator Terminals Package style L GDIP3-T24 24 dual-in-line package 3 CQCC1-N28 28 leadless chip carrier

The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M.

Storage Temperature ..................................................... −65°C to +125°C Supply voltage with respect to ground (VCC) ............................. −0.5 V to +7.0 v Input signal with respect to ground ..................................... −3.0 V to +7.0 V Signal applied to high impedance output ................................. −3.0 V to +7.0 V Output current into low outputs ......................................... 25 mA Latchup current ......................................................... > 400 mA Thermal resistance Junction-to-case (ΘJC) ................................ See MIL-STD-1835 Lead temperature (soldering, 10 seconds) ................................ +275°C Power dissipation (PD) .................................................. 250 mW Maximum junction temperature ............................................ 175°C

Operating ambient temperature ........................................... −55°C to +125°C Supply voltage range .................................................... 4.5 V ≤ VCC ≤ 5.5 V

Fault coverage measurements of manufacturing logic test (MIL-STD-883, test method 5012 .......................... XX percent 2/

intended Use:

Microcircuits conforming to this drawing are intended for use for Government microcircuit applications(original equipment), design applications, and logistics purposes.

Microcircuits... View More

Document History

January 6, 2000
MICROCIRCUIT, DIGITAL, VARIABLE LENGTH SHIFT REGISTER, MONOLITHIC SILICON
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes. Microcircuits covered by...
SMD-5962-96793
February 10, 1997
MICROCIRCUIT, DIGITAL, VARIABLE LENGTH SHIFT REGISTER, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
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