NAVISTAR - CEMS DT-14
Surface Waviness Definition via Loria (R) Analyzer
inactive
| Organization: | NAVISTAR |
| Publication Date: | 1 April 2001 |
| Status: | inactive |
| Page Count: | 2 |
scope:
This test method describes the procedure used to quantitatively determine the surface waviness of SMC substrates used for Class A exterior applications. The surface quality is evaluated in terms of a Loria® Index Value.
Document History
October 1, 2016
VOID - Surface Waviness Definition via ALSA Analyzer
A description is not available for this item.
April 1, 2009
Surface Waviness Definition via ALSA Analyzer
This test method describes the procedure used to quantitatively determine the surface waviness of SMC substrates used for Class A exterior applications. The surface quality is evaluated in terms of...
CEMS DT-14
April 1, 2001
Surface Waviness Definition via Loria (R) Analyzer
This test method describes the procedure used to quantitatively determine the surface waviness of SMC substrates used for Class A exterior applications. The surface quality is evaluated in terms of a...
References
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