DS/EN 60749/A1
Semiconductor devices - Mechanical and climatic test methods
inactive
| Organization: | DS |
| Publication Date: | 11 October 2001 |
| Status: | inactive |
| Page Count: | 15 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
scope:
This standard lists test methods applicable to semiconductor devices (discrete devices and integrated circuits) from which a selection may be made. However, additional test methods may be required for non-cavity devices. This standard has taken into account, wherever possible, IEC 68. The object of this standard is to establish uniform preferred test methods with preferred values for stress levels for judging the environmental properties of semiconductor devices.
Document History
July 5, 2002
Semiconductor devices - Mechanical and climatic test methods
This document has been prepared by IEC Technical Committee 47, working group 2, Environmental Tests. Activity within working group 2 includes the generation, co-ordination and review of climatic,...
DS/EN 60749/A1
October 11, 2001
Semiconductor devices - Mechanical and climatic test methods
This standard lists test methods applicable to semiconductor devices (discrete devices and integrated circuits) from which a selection may be made. However, additional test methods may be required...
December 7, 1999
Semiconductor devices - Mechanical and climatic test methods
This International Standard lists test methods applicable to semiconductor devices (discrete devices and integrated circuits) from which a selection may be made. However, additional test methods may...
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