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DLA - SMD-5962-94502 REV A

MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, 16-BIT BUS TRANSCEIVER AND REGISTER WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON

inactive
Organization: DLA
Publication Date: 23 May 1997
Status: inactive
Page Count: 22
scope:

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN.

The PIN is as shown in the following example:

Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.

The device type(s) identify the circuit function as follows:

Device type Generic number Circuit function 01 54ABT16646 16-bit bus transceiver and register with three-state outputs, TTL compatible inputs 02 54ABT16646 16-bit bus transceiver and register with three-state outputs, TTL compatible inputs

The device class designator is a single letter identifying the product assurance level as follows:

Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535

The case outline(s) are as designated in MIL-STD-1835 and as follows:

Outline letter Descriptive designator Terminals Package style X GDFP1-F56 56 Flat pack

The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M.

Supply voltage range (VCC) ........................................ −0.5 V dc to +7.0 V dc DC input voltage range (I/O port) (VIN) ........................... −0.5 V dc to +5.5 V dc 4/ DC input voltage range ( except I/O port) (VIN) ................... −0.5 V dc to +7.0 V dc 4/ DC output voltage range (VOUT) .................................... −0.5 V dc to +5.5 V dc 4/ DC output current (IOL) (per output) .............................. +96 mA DC input clamp current (IIK) (VIN <0.0 V) ......................... −18 mA DC output clamp current (IOK) (VOUT < 0.0 V) ...................... −50 mA VCC current (IVCC) ................................................ 514 mA Ground current (IGND) ............................................. 1056 mA Storage temperature range (TSTG) .................................. −65°C to + 150°C Lead temperature (soldering, 10 seconds) .......................... +300°C Thermal resistance, junction-to-case (ΘJC) ........................ See MIL-STD-1835 Junction temperature (TJ) ......................................... +175°C Maximum power dissipation at (PD) ................................. 598 mW 5/

Supply voltage range (VCC) ........................................ +4.5 V dc to +5.5 V dc Input voltage range (VIN) ......................................... 0.0 V dc to VCC Output voltage range (VOUT) ....................................... 0.0 V dc to VCC Minimum high level input voltage (VIH) ............................ 2.0 V Maximum low level input voltage (VIL) ............................. 0.8 V Maximum high level output current (IOH) ........................... −24 mA Maximum low level output current (IOL) ............................ 48 mA Maximum input rise and fall rate (Δt/ΔV)(outputs enabled) ......... 10 ns/V Operating case temperature range (TC) ............................. −55°C to +125°C

Fault coverage measurement of manufacturing logic tests (MIL-STD-883, test method 5012) ...................... XX percent 6/

intended Use:

Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.

Microcircuits... View More

Document History

March 22, 2021
MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, 16-BIT BUS TRANSCEIVER AND REGISTER WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q ) and space application (device class V). A choice of case outlines and lead...
July 15, 2014
MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, 16-BIT BUS TRANSCEIVER AND REGISTER WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
May 12, 2008
MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, 16-BIT BUS TRANSCEIVER AND REGISTER WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
SMD-5962-94502 REV A
May 23, 1997
MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, 16-BIT BUS TRANSCEIVER AND REGISTER WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M and space application (device class V). A choice of case outlines and lead finishes...
July 22, 1994
MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, 16-BIT BUS TRANSCEIVER AND REGISTER WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes Q and M) and...
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