Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric)
|Publication Date:||10 November 1995|
|ICS Code (Integrated circuits. Microelectronics):||31.200|
This guide is to assist experimenters in measuring the transient radiation upset threshold of silicon digital integrated circuits exposed to pulses of ionizing radiation greater than 10³ Gy (Si)/s.
This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.