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BSI - BS EN 120001

Specification for Harmonized system of quality assessment for electronic components - Blank detail specification - Light emitting diodes, light emitting diode arrays, light emitting diode displays without internal logic and resistor

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Organization: BSI
Publication Date: 15 November 1991
Status: active
Page Count: 20
ICS Code (Optoelectronics. Laser equipment): 31.260

Document History

BS EN 120001
November 15, 1991
Specification for Harmonized system of quality assessment for electronic components - Blank detail specification - Light emitting diodes, light emitting diode arrays, light emitting diode displays without internal logic and resistor
A description is not available for this item.

References

This document references:
BS 9000-2 - General Requirements for a System for Electronic Components of Assessed Quality Part 2: Specification for the National Implementation of the CECC System
Published by BSI on May 15, 1996
A description is not available for this item.
This document references:
BS 6001-1 - Sampling procedures for inspection by attributes - Part 1: Sampling schemes indexed by acceptance quality limit (AQL) for lot-by-lot inspection
Published by BSI on December 15, 1999
A description is not available for this item.
This document references:
PD 9004 - BS 9000 CECC & IECQ UK Administrative Guide
Published by BSI on November 15, 1989
Contains a detailed explanation of the BS 9000, CECC and IECQ systems and the means by which they are operated in the UK. Includes general information and special procedures, and all current issues...
This document references:
BS CECC 20000 - Harmonized system of quality assessment for electronic components: Generic specification: Semiconductor optoelectronic and liquid crystal devices
Published by BSI on June 30, 1983
Prescribes quality assessment procedures and test and measurement conditions applicable to semiconductor optoelectronic and liquid crystal devices.
This document references:
BS 6001-4 - Sampling procedures for inspection by attributes - Part 4: System of sequential sampling plans indexed by acceptance quality limit (AQL) for lot-by-lot inspection
Published by BSI on August 4, 2005
A description is not available for this item.
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