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ASTM International - ASTM F532-81(1987)

Test Methods for Measuring Width of Defects in Optical Surfaces, Using Nomarski Differential Microscopy

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Organization: ASTM International
Publication Date: 1 January 1981
Status: inactive
ICS Code (Properties of surfaces): 17.040.20

Document History

January 1, 1987
Test Methods for Measuring Width of Defects in Optical Surfaces, Using Nomarski Differential Microscopy (Withdrawn 1994)
A description is not available for this item.
ASTM F532-81(1987)
January 1, 1981
Test Methods for Measuring Width of Defects in Optical Surfaces, Using Nomarski Differential Microscopy
A description is not available for this item.
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