ASTM International - ASTM F532-81(1987)
Test Methods for Measuring Width of Defects in Optical Surfaces, Using Nomarski Differential Microscopy
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| Organization: | ASTM International |
| Publication Date: | 1 January 1981 |
| Status: | inactive |
| ICS Code (Properties of surfaces): | 17.040.20 |
Document History
January 1, 1987
Test Methods for Measuring Width of Defects in Optical Surfaces, Using Nomarski Differential Microscopy (Withdrawn 1994)
A description is not available for this item.
ASTM F532-81(1987)
January 1, 1981
Test Methods for Measuring Width of Defects in Optical Surfaces, Using Nomarski Differential Microscopy
A description is not available for this item.