ASTM International - ASTM F632-90
Test Method for Measuring Small-Signal Comon Emitter Current Gain of Transistors at High Frequencies (Withdrawn 1995)
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| Organization: | ASTM International |
| Publication Date: | 1 January 1990 |
| Status: | inactive |
| Page Count: | 6 |
| ICS Code (Transistors): | 31.080.30 |
Document History
ASTM F632-90
January 1, 1990
Test Method for Measuring Small-Signal Comon Emitter Current Gain of Transistors at High Frequencies (Withdrawn 1995)
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