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ASTM International - ASTM F1032-91

Guide for Measuring Time-Dependant Total-Dose Effects in Semiconductor Devices Exposed to Pulsed Ionizing Radiation (Withdrawn 1994)

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Organization: ASTM International
Publication Date: 1 January 1991
Status: inactive
Page Count: 3
ICS Code (Semiconductor devices in general): 31.080.01

Document History

ASTM F1032-91
January 1, 1991
Guide for Measuring Time-Dependant Total-Dose Effects in Semiconductor Devices Exposed to Pulsed Ionizing Radiation (Withdrawn 1994)
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