ASTM International - ASTM F1032-91
Guide for Measuring Time-Dependant Total-Dose Effects in Semiconductor Devices Exposed to Pulsed Ionizing Radiation (Withdrawn 1994)
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| Organization: | ASTM International |
| Publication Date: | 1 January 1991 |
| Status: | inactive |
| Page Count: | 3 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
ASTM F1032-91
January 1, 1991
Guide for Measuring Time-Dependant Total-Dose Effects in Semiconductor Devices Exposed to Pulsed Ionizing Radiation (Withdrawn 1994)
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