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ASTM International - ASTM F1191-88

Guide for the Radiation Testing of Semiconductor Memories (Withdrawn 1993)

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Organization: ASTM International
Publication Date: 1 January 1988
Status: inactive
Page Count: 7
ICS Code (Semiconductor devices in general): 31.080.01

Document History

ASTM F1191-88
January 1, 1988
Guide for the Radiation Testing of Semiconductor Memories (Withdrawn 1993)
A description is not available for this item.
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