ASTM International - ASTM F466-79(1992)
Test Method for Small-Signal Scattering Parameters of Low-Power Transistors in the 0.2 to 2.0 GHZ Frequency Range (Withdrawn 1997)
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| Organization: | ASTM International |
| Publication Date: | 1 January 1979 |
| Status: | inactive |
| Page Count: | 8 |
| ICS Code (Transistors): | 31.080.30 |
Document History
ASTM F466-79(1992)
January 1, 1979
Test Method for Small-Signal Scattering Parameters of Low-Power Transistors in the 0.2 to 2.0 GHZ Frequency Range (Withdrawn 1997)
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