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ASTM International - ASTM F466-79(1992)

Test Method for Small-Signal Scattering Parameters of Low-Power Transistors in the 0.2 to 2.0 GHZ Frequency Range (Withdrawn 1997)

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Organization: ASTM International
Publication Date: 1 January 1979
Status: inactive
Page Count: 8
ICS Code (Transistors): 31.080.30

Document History

ASTM F466-79(1992)
January 1, 1979
Test Method for Small-Signal Scattering Parameters of Low-Power Transistors in the 0.2 to 2.0 GHZ Frequency Range (Withdrawn 1997)
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