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ASTM International - ASTM F1340-92

Test Method for Determining the Mean Interface Trap Density of Mosfets by Charge-Pumping (Withdrawn 1997)

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Organization: ASTM International
Publication Date: 1 January 1992
Status: inactive
Page Count: 5
ICS Code (Transistors): 31.080.30

Document History

ASTM F1340-92
January 1, 1992
Test Method for Determining the Mean Interface Trap Density of Mosfets by Charge-Pumping (Withdrawn 1997)
A description is not available for this item.
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