ASTM International - ASTM F1340-92
Test Method for Determining the Mean Interface Trap Density of Mosfets by Charge-Pumping (Withdrawn 1997)
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Organization: | ASTM International |
Publication Date: | 1 January 1992 |
Status: | inactive |
Page Count: | 5 |
ICS Code (Transistors): | 31.080.30 |
Document History

ASTM F1340-92
January 1, 1992
Test Method for Determining the Mean Interface Trap Density of Mosfets by Charge-Pumping (Withdrawn 1997)
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