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ASTM International - ASTM C982-03

Standard Guide for Selecting Components for Energy-Dispersive X-Ray Fluorescence (XRF) Systems (Withdrawn 2008)

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Organization: ASTM International
Publication Date: 10 July 2003
Status: inactive
Page Count: 4
ICS Code (Fissile materials and nuclear fuel technology): 27.120.30
significance And Use:

This guide describes typical prospective analytical X-ray fluorescence systems that may be used for qualitative and quantitative elemental analysis of materials related to the nuclear fuel... View More

scope:

1.1 This guide describes the components for an energy-dispersive X-ray fluorescence (XRF) system for materials analysis. It can be used as a reference in the apparatus section of test methods for energy-dispersive X-ray fluorescence analyses of nuclear materials.

1.2 The components recommended include X-ray detectors, signal processing electronics, data acquisition and analysis systems, and excitation sources that emit photons (See ).

1.3 Detailed data analysis methods are not described or recommended, as they may be unique to a particular analysis problem. Some applications may require the use of spectrum deconvolution to separate partially resolved peaks or to correct for matrix effects in data reduction.

1.4 This standard does not purport to address all of the safety problems, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Document History

ASTM C982-03
July 10, 2003
Standard Guide for Selecting Components for Energy-Dispersive X-Ray Fluorescence (XRF) Systems (Withdrawn 2008)
1.1 This guide describes the components for an energy-dispersive X-ray fluorescence (XRF) system for materials analysis. It can be used as a reference in the apparatus section of test methods for...
May 10, 1997
Standard Guide for Selecting Components for Energy-Dispersive X-Ray Fluorescence (XRF) Systems
1.1 This guide describes the components for an energy-dispersive X-ray fluorescence (XRF) system for materials analysis. It can be used as a reference in the apparatus section of test methods for...
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