DLA - SMD-5962-91528
MICROCIRCUIT, DIGITAL, ECL, OR/NOR GATES, MONOLITHIC SILICON
| Organization: | DLA |
| Publication Date: | 5 February 1991 |
| Status: | inactive |
| Page Count: | 16 |
scope:
This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes B, Q, and M) and space application (device classes S and V), and a choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). Device class M microcircuits represent non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883, "Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices". When available, a choice of radiation hardness assurance (RHA) levels are reflected in the PIN.
The PIN shall be as shown in the following example:
Device classes M, B, and S RHA marked devices shall meet the MIL-M-38510 specified RHA levels and shall be marked with the appropriate RHA designator. Device classes Q and V RHA marked devices shall meet the MIL-I-38535 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.
The device type(s) shall identify the circuit function as follows:
Device type Generic number Circuit function 01 100301 Triple 5-input OR/NOR gate 02 100302 Quint 2-input OR/NOR gate
The device class designator shall be a single letter identifying the product assurance level as follows:
Device class Device requirements documentation M Vendor self-certification to the requirements for non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883 B or S Certification and qualification to MIL-M-38510 Q or V Certification and qualification to MIL-I-38535
For device classes M, B, and S, case outline(s) shall meet the requirements in appendix C of MIL-M-38510 and as listed below. For device classes Q and V, case outline(s) shall meet the requirements of MIL-I-38535, appendix C of MIL-M-38510, and as listed below.
Outline letter Case outline X D-11 (24-lead, 1.250" × .410 × .225"), dual-in-line package Y See figure 1, (24-lead, .410" × .410" × .0851"), quad flat package
The lead finish shall be as specified in MIL-M-38510 for classes M, B, and S or MIL-I-38535 for classes Q and V. Finish letter "X" shall not be marked on the microcircuit or its packaging. The "X" designation is for use in specifications when lead finishes A, B, and C are considered acceptable and interchangeable without preference.
Negative supply voltage range (VEE) - - - - - - - - −7.0 V dc to +0.5 V dc DC input voltage range (VIN) - - - - - - - - - - - - VEE to +0.5 V Maximum dc output current (IOUT) - - - - - - - - - - −50 mA Storage temperature range - - - - - - - - - - - - - −65°C to +150°C Lead temperature (soldering, 10 seconds) - - - - - - +300°C Junction temperature (TJ) - - - - - - - - - - - - - +175°C Maximum power dissipation (PD): Device type 01 - - - - - - - - - - - - - - - - - - 304 mW Device type 02 - - - - - - - - - - - - - - - - - - 453 mW Thermal resistance, junction-to-case (θJC) - - - - - See MIL-M-38510, appendix C
Negative supply voltage range (VEE) - - - - - - - - −5.7 V minimum to −4.2 V maximum Case operating temperature range (TC) - - - - - - - −55°C to +125°C High level input voltage range (VIH) - - - - - - - - −1.165 V minimum to −0.870 V maximum Low level input voltage range (VIL) - - - - - - - - −1.830 V minimum to −1.475 V maximum
Fault coverage measurement of manufacturing logic tests (MIL-STD-883, test method 5012) - - - xx percent 2/
intended Use:
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.
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