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DLA - SMD-5962-91528

MICROCIRCUIT, DIGITAL, ECL, OR/NOR GATES, MONOLITHIC SILICON

inactive
Organization: DLA
Publication Date: 5 February 1991
Status: inactive
Page Count: 16
scope:

This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes B, Q, and M) and space application (device classes S and V), and a choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). Device class M microcircuits represent non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883, "Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices". When available, a choice of radiation hardness assurance (RHA) levels are reflected in the PIN.

The PIN shall be as shown in the following example:

Device classes M, B, and S RHA marked devices shall meet the MIL-M-38510 specified RHA levels and shall be marked with the appropriate RHA designator. Device classes Q and V RHA marked devices shall meet the MIL-I-38535 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.

The device type(s) shall identify the circuit function as follows:

Device type Generic number Circuit function 01 100301 Triple 5-input OR/NOR gate 02 100302 Quint 2-input OR/NOR gate

The device class designator shall be a single letter identifying the product assurance level as follows:

Device class Device requirements documentation M Vendor self-certification to the requirements for non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883 B or S Certification and qualification to MIL-M-38510 Q or V Certification and qualification to MIL-I-38535

For device classes M, B, and S, case outline(s) shall meet the requirements in appendix C of MIL-M-38510 and as listed below. For device classes Q and V, case outline(s) shall meet the requirements of MIL-I-38535, appendix C of MIL-M-38510, and as listed below.

Outline letter Case outline X D-11 (24-lead, 1.250" × .410 × .225"), dual-in-line package Y See figure 1, (24-lead, .410" × .410" × .0851"), quad flat package

The lead finish shall be as specified in MIL-M-38510 for classes M, B, and S or MIL-I-38535 for classes Q and V. Finish letter "X" shall not be marked on the microcircuit or its packaging. The "X" designation is for use in specifications when lead finishes A, B, and C are considered acceptable and interchangeable without preference.

Negative supply voltage range (VEE) - - - - - - - - −7.0 V dc to +0.5 V dc DC input voltage range (VIN) - - - - - - - - - - - - VEE to +0.5 V Maximum dc output current (IOUT) - - - - - - - - - - −50 mA Storage temperature range - - - - - - - - - - - - - −65°C to +150°C Lead temperature (soldering, 10 seconds) - - - - - - +300°C Junction temperature (TJ) - - - - - - - - - - - - - +175°C Maximum power dissipation (PD): Device type 01 - - - - - - - - - - - - - - - - - - 304 mW Device type 02 - - - - - - - - - - - - - - - - - - 453 mW Thermal resistance, junction-to-case (θJC) - - - - - See MIL-M-38510, appendix C

Negative supply voltage range (VEE) - - - - - - - - −5.7 V minimum to −4.2 V maximum Case operating temperature range (TC) - - - - - - - −55°C to +125°C High level input voltage range (VIH) - - - - - - - - −1.165 V minimum to −0.870 V maximum Low level input voltage range (VIL) - - - - - - - - −1.830 V minimum to −1.475 V maximum

Fault coverage measurement of manufacturing logic tests (MIL-STD-883, test method 5012) - - - xx percent 2/

intended Use:

Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.

Microcircuits... View More

Document History

November 10, 2020
MICROCIRCUIT, DIGITAL, ECL, OR/NOR GATES, MONOLITHIC SILICON
Scope. This drawing documents two product assurance class levels consisting of high reliability (device class Q and M) and space application (device class V). A choice of case outlines and lead...
August 14, 2014
MICROCIRCUIT, DIGITAL, ECL, OR/NOR GATES, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device class Q and M) and space application (device class V). A choice of case outlines and lead finishes are...
August 1, 2006
MICROCIRCUIT, DIGITAL, ECL, OR/NOR GATES, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
April 26, 1996
MICROCIRCUIT, DIGITAL, ECL, OR/NOR GATES, MONOLITHIC SILICON
A description is not available for this item.
SMD-5962-91528
February 5, 1991
MICROCIRCUIT, DIGITAL, ECL, OR/NOR GATES, MONOLITHIC SILICON
This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes B, Q, and M) and...

References

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