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ASTM International - ASTM E2444-05

Terminology Relating to Measurements Taken on Thin, Reflecting Films

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Organization: ASTM International
Publication Date: 1 May 2005
Status: inactive
Page Count: 3
ICS Code (Electronics (Vocabularies)): 01.040.31
ICS Code (Mechanical structures for electronic equipment): 31.240
scope:

1.1 This standard consists of terms and definitions pertaining to measurements taken on thin, reflecting films, such as found in microelectromechanical systems (MEMS) materials. In particular, the terms are related to the standards in Section , which were generated by Committee E08 on Fatigue and Fracture. Terminology E 1823 Relating to Fatigue and Fracture Testing is applicable to this standard.

1.2 The terms are listed in alphabetical order.

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