UNLIMITED FREE
ACCESS
TO THE WORLD'S BEST IDEAS

SUBMIT
Already a GlobalSpec user? Log in.

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

Customize Your GlobalSpec Experience

Finish!
Privacy Policy

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

ASTM International - ASTM E801-06

Standard Practice for Controlling Quality of Radiological Examination of Electronic Devices

inactive
Buy Now
Organization: ASTM International
Publication Date: 1 December 2006
Status: inactive
Page Count: 4
ICS Code (Non-destructive testing): 19.100
scope:

1.1 This practice relates to the radiological examination of electronic devices for internal discontinuities, extraneous material, missing components, crimped or broken wires, and defective solder joints in cavities, in the encapsulating materials, or the boards. Requirements expressed in this practice are intended to control the quality and repeatability of the radiological images and are not intended for controlling the acceptability or quality of the electronic devices imaged. Note 1 - Refer to the following publications for pertinent information on methodology and safety and protection: Guides E 94 and E 1000, and "General Safety Standard for Installation Using Non-Medical X Ray and Sealed Gamma Ray Sources, Energies Up to 10 MeV Equipment Design and Use," Handbook No. 114.

1.2 If a nondestructive testing agency as described in Practice E 543 is used to perform the examination, the testing agency should meet the requirements of Practice E 543.

This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

abstract:

This practice is intended to control the quality and repeatability of the radiological examination of electronic devices for internal discontinuities, extraneous material, missing components,... View More

Document History

November 1, 2021
Standard Practice for Controlling Quality of Radiographic Examination of Electronic Devices
1.1 This practice relates to the radiographic examination of electronic devices for internal discontinuities, extraneous material, missing components, crimped or broken wires, and defective solder...
December 1, 2016
Standard Practice for Controlling Quality of Radiographic Examination of Electronic Devices
1.1 This practice relates to the radiographic examination of electronic devices for internal discontinuities, extraneous material, missing components, crimped or broken wires, and defective solder...
December 1, 2011
Standard Practice for Controlling Quality of Radiological Examination of Electronic Devices
1.1 This practice relates to the radiological examination of electronic devices for internal discontinuities, extraneous material, missing components, crimped or broken wires, and defective solder...
ASTM E801-06
December 1, 2006
Standard Practice for Controlling Quality of Radiological Examination of Electronic Devices
This practice is intended to control the quality and repeatability of the radiological examination of electronic devices for internal discontinuities, extraneous material, missing components, crimped...
June 10, 2001
Standard Practice for Controlling Quality of Radiological Examination of Electronic Devices
1.1 This practice relates to the radiological examination of electronic devices for internal discontinuities, extraneous material, missing components, crimped or broken wires, and defective solder...
June 10, 2001
Standard Practice for Controlling Quality of Radiological Examination of Electronic Devices
1.1 This practice relates to the radiological examination of electronic devices for internal discontinuities, extraneous material, missing components, crimped or broken wires, and defective solder...
January 1, 1995
Standard Practice for Controlling Quality of Radiological Examination of Electronic Devices
A description is not available for this item.
Advertisement