IPC - TM-650 2.5.19.1A
Propagation Delay of Flat Cables Using Dual Trace Oscilloscope
active, Most Current
| Organization: | IPC |
| Publication Date: | 1 July 1984 |
| Status: | active |
| Page Count: | 4 |
scope:
This test method describes the test procedures required to measure propagation delay in flat cables. This test method is an alternative to IPC-TM-650, Method 2.5.19. Propagation delay is defined as the time required for a pulse to traverse a unit length of cable. Excessive propagation delay will result in the malfunction of critical circuits due to the late arrival of pulses. Propagation delay is directly proportional to the effective dielectric constant of the insulation.
Document History
TM-650 2.5.19.1A
July 1, 1984
Propagation Delay of Flat Cables Using Dual Trace Oscilloscope
This test method describes the test procedures required to measure propagation delay in flat cables. This test method is an alternative to IPC-TM-650, Method 2.5.19. Propagation delay is defined as...