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ASTM International - ASTM E766-98

Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope

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Organization: ASTM International
Publication Date: 10 December 1998
Status: inactive
Page Count: 6
ICS Code (Optical equipment): 37.020
scope:

1.1 This practice is designed to calibrate the magnification of scanning electron microscopes (SEMs) using the National Institute of Standards and Technology (NIST) calibration specimen Standard Reference Material (SRM)484. Since the relationship between true magnification and magnification indicated on the SEM readout may be different at different magnifications, this practice must be applied to each magnification for which true magnification is desired.

1.2 This standard does not purport to address all of the safety problems, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Document History

November 1, 2019
Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
4.1 Proper use of this practice can yield calibrated magnifications with precision of 5 % or better within a magnification range of from 10 to 50 000X. 4.2 The use of calibration specimens traceable...
January 1, 2014
Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
4.1 Proper use of this practice can yield calibrated magnifications with precision of 5 % or better within a magnification range of from 10 to 50 000X. 4.2 The use of calibration specimens traceable...
January 1, 2014
Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
4.1 Proper use of this practice can yield calibrated magnifications with precision of 5 % or better within a magnification range of from 10 to 50 000X. 4.2 The use of calibration specimens traceable...
June 15, 2008
Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
Proper use of this practice can yield calibrated magnifications with precision of 5 % or better within a magnification range of from 10 to 50 000X. The use of calibration specimens traceable to...
November 1, 2003
Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
Proper use of this practice can yield calibrated magnifications with precision of 5 % or better within a magnification range of from 10 to 50 000X. The use of calibration specimens traceable to...
ASTM E766-98
December 10, 1998
Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
1.1 This practice is designed to calibrate the magnification of scanning electron microscopes (SEMs) using the National Institute of Standards and Technology (NIST) calibration specimen Standard...
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