ASTM International - ASTM C1371-04a(2010)e1
Standard Test Method for Determination of Emittance of Materials Near Room Temperature Using Portable Emissometers
|Publication Date:||1 November 2010|
|ICS Code (Heat. Calorimetry):||17.200.10|
significance And Use:
Surface Emittance Testing:
Thermal radiation heat transfer is reduced if the surface of a material has a low emittance. Since the controlling factor in the use of insulation is sometimes... View More
Surface Emittance Testing:
Thermal radiation heat transfer is reduced if the surface of a material has a low emittance. Since the controlling factor in the use of insulation is sometimes condensation control or personnel protection, it is important to note that a low emittance will also change the surface temperature of a material. One possible criterion in the selection of these materials is the question of the effect of aging on the surface emittance. If the initial low surface emittance of a material is not maintained during service, then the long-term value of the material is diminished.
This test method provides a means for comparative periodic testing of low emittance surfaces in the field. In this way the effects of aging on the reflective properties can be monitored.
This test method can be used to measure the total hemispherical emittance with a precision of better than ±0.02 units, if some care is taken to avoid potential misapplications. (1) The emittances of the calibration standards shall have been obtained from accurate independent measurements of total hemispherical emittance. This test method shall not be used for specimens that are highly anisotropic or transparent to infrared radiation. This test method also shall not be used for specimens with significant thermal resistance (see 7.3.4).View Less
1.1 This test method covers a technique for determination of the emittance of typical materials using a portable differential thermopile emissometer. The purpose of the test method is to provide a comparative means of quantifying the emittance of opaque, highly thermally conductive materials near room temperature as a parameter in evaluating temperatures, heat flows, and derived thermal resistances of materials.
1.2 This test method does not supplant Test Method C835, which is an absolute method for determination of total hemispherical emittance, or Test Method E408, which includes two comparative methods for determination of total normal emittance. Because of the unique construction of the portable emissometer, it can be calibrated to measure the total hemispherical emittance. This is supported by comparison of emissometer measurements with those of Test Method C835 (1).
1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.